36. Comparison of intensity profile analysis and correlation function methods for studying the lamellar structures of semicrystalline polymers using small-angle X-ray scattering
writer：Wang ZG, Hsiao BS, Murthy NS
keywords：相關函數法，散射強度法，片晶厚度
source：期刊
specific source：Journal of Applied Crystallography, 2000, 33 (1), 690-694.
Issue time：2000年
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